|
|
| |
|
|
| |
Speaker:
Eric
Ungar, PE
Acentech,
Incorporated
Hal Amick, PE
Colin
Gordon and Associates |
|
| |
This presentation discusses the tests used to document vibration
sensitivity will be discussed, and this will lead to a presentation
of generic vibration criteria.
The first session discussed means by
which the designer controls vibrations within the building
system itself. In many cases, however, it is desirable to
reduce vibrations at the equipment itself, using either external
or internal vibration isolation systems. Options are discussed
for internal
vibration isolation systems-usually within the purview of
the equipment designer-as well as external isolation systems-under
the control of either the building designer or the equipment
user.
|
(2.7
MB) |
| |
|
|
|
|
|
| |
|
|
| |
Speaker:
Eric
Ungar, PE
Acentech,
Incorporated
Hal Amick, PE
Colin
Gordon and Associates |
|
| |
In order to discuss the process of vibration control in advanced
technology facilities, one must have a rudimentary understanding
of how vibrations are characterized. This presentation will
open with a discussion of some of the vocabulary and quantities
associated with vibrations and their
representation. The basic quantities of sinusoidal vibrations
will be discussed, along with those associated with random and/or
impact excitation. Typical interior and exterior sources are
discussed, along with typical approaches to their control.
|
(1.6
MB) |
| |
|
|
|
|
|
| |
|
|
| |
Speaker:
Rod
Horning
TMC
Manufacturing |
|
| |
The presentation discusses passive isolation systems including
very low stiffness mechanical and pneumatic isolation tables.
Active vibration isolation systems including soft electro-pneumatic
and stiff piezo electric systems will also be presented. The
advantages and limitations of each type of isolation system
will be presented. The need for a well damped platform between
the isolation system and the instrument will be shown. The use
of isolation systems with instruments having an internal isolation
system will also be discussed.
|
(presentation
not available)
|
| |
|
|
|
|
|
| |
|
|
| |
Speaker:
Joe
Stroscio
NIST
|
|
| |
The Nanoscale Physics Facility in the NIST Physics Laboratory
contains one of the most sophisticated scanning tunneling microscope
systems for nanoscale physics research, and posed a number of
engineering challenges to meet its design goals. This presentation
discusses the challenges to meet these design goals, including
solutions to overcome building environmental noise sources,
as well as the design details needed in operation of a scanning
tunneling microscope in these environments. Operation of the
facility will be highlighted from recent studies.
|
(presentation
not available)
|
| |
|
|
|
Overview
Presentations 
Registration
